AutoCAF2+

CAF tester description

Conductive anodic filament (CAF) failure is copper corrosion within a printed board. It is electro-migration of the copper from Anode to Cathode between two conductors of different potential, whereas growth from Cathode to Anode is a dendrite.
A combination of bias voltage and high humidity enhances CAF failures. Electrical failure results when a filament grows between electrically isolated nets. See IPC-9691 for further information on CAF.

• Measurements from all 256 Channels can be taken in <30 seconds
• Applied Voltage: +1V to 1250V
• Measurement Range: 10⁶ ? to 10¹⁴ ?
• Measurement Method: Continuous on all selected channels
• Measurement Test Intervals: Fully selectable from a minimum of 1 minute
• Capable of testing to all existing test specifications – IPC – IEC – JNC and other user specifications
• Future-proofed design
• AutoCAF2+ is available with 64, 128 or 256 channel configurations
• Adaptable and flexible software operating with Windows 7, 8 &10.